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| B321611J700TM资料 | |
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B321611J700TM PDF Download |
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File Size : 116 KB
Manufacturer: Description:All MAX® II devices provide Joint Test Action Group (JTAG) boundary- scan test (BST) circuitry that complies with the IEEE Std. 1149.1-2001 specification. JTAG boundary-scan testing can only be performed at any time after VCCINT and all VCCIO banks have been fully powered and a tCONFIG amount of time has passed. MAX II devices can also use the JTAG port for in-system programming together with either the Quartus® II software or hardware using Programming Object Files (.pof), JamTM Standard Test and Programming Language (STAPL) Files (.jam) or Jam Byte-Code Files (.jbc). |
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| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：B321611J700TM 厂 家： 封 装：08＋ 批 号：6000 数 量： 说 明：原装现货 |
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运 费： 所在地： 新旧程度： |
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| 联系人：林小姐 |
| 电 话：0755-83041767,82716726 |
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| 公司地址： 深圳市福田区华强北佳和大厦4C143 |
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