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| CNF41C220S-TM资料 | |
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CNF41C220S-TM PDF Download |
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File Size : 116 KB
Manufacturer: Description:NOTE Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing. |
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| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：CNF41C220S-TM 厂 家： 封 装：08＋无铅 批 号：4350 数 量： 说 明：原装现货 |
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运 费： 所在地： 新旧程度： |
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| 联系人：林小姐 |
| 电 话：0755-83041767,82716726 |
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| 公司地址： 深圳市福田区华强北佳和大厦4C143 |
