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LQH32CN470K53L

LQH32CN470K53L资料
LQH32CN470K53L
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File Size : 116 KB
Manufacturer:MURATA
Description:  Screen tested 100% on each device at +25C, +125C and -55C temperature, subgroups A1,   2 and 3. Note 2: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C   temperature, subgroups A1, 2 and 3. Note 3: Screen tested 100% on each device at +25C and +125C temperature only, subgroup A1 and   2. Note 4: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C and +125C temperature   only, subgroup A1 and 2. Note 5: Screen tested 100% on each device at +25C temperature only, subgroup A1. Note 6: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C temperature only,   subgroup A1. Note 7: Screen tested 100% on each device at +25C temperature only, subgroup A9. Note 8: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C and -55C   temperature, subgroups A9, 10 and 11. Note 9: VIL, VIH, IOL and IOH are guaranteed by applying specified conditions and testing VOL   and VOH. Note 10: Guaranteed parameter. This test is only performed during qualification. Note 11: Guaranteed parameter, not tested. Note 12: Drift values need not be calculated if post burn-in electrical test is performed   within 24 hours after burn-in.
 
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型 号:LQH32CN470K53L
厂 家:MURATA
封 装:08+
批 号:12000
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说 明:原装现货
 
 
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