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| LQP15MN15NG02D资料 | |
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LQP15MN15NG02D PDF Download |
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File Size : 116 KB
Manufacturer: Description:Notes: 1Tester measures code transitions by dithering the voltage of the analog input (VIN ). The difference between the measured and the ideal code width (VREF /256) is the DNL error (Figure 2.). The INL error is the maximum distance (in LSBs) from the best fit line to any transition voltage (Figure 3.). Accuracy is a function of the sampling rate (FS). 2Guaranteed. Not tested. 3Specified values guarantee functionality. Refer to other parameters for accuracy. 4--1 dB bandwidth is a measure of performance of the A/D input stage (S/H + amplifier). Refer to other parameters for accuracy within the specified bandwidth. 5See VIN input equivalent circuit (Figure 4.). Switched capacitor analog input requires driver with low output resistance. 6All inputs have diodes to DVDD and DGND. Input DC currents will not exceed specified limits for any input voltage between DGND and DVDD . 7tR , tF should be limited to >5 ns for best results. 8Depends on the RC load connected to the output pin. 9AGND and DGND pins are connected through the silicon substrate. Connect together at the package and to the analog ground plane. |
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| 1PCS | 100PCS | 1K | 10K | ||
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型 号：LQP15MN15NG02D 厂 家： 封 装：08＋ 批 号：70000 数 量： 说 明：原装现货 |
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运 费： 所在地： 新旧程度： |
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| 联系人：林小姐 |
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