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NFA31CC221S1E4D资料 | |
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NFA31CC221S1E4D PDF Download |
File Size : 116 KB
Manufacturer:MURATA Description:NOTES: (1) Test levels: (A) 100% tested at 25C. Over temperature limits by characterization and simulation. (B) Limits set by characterization and simulation. (C) Typical value only for information. (2) Junction temperature = ambient for 25C guaranteed specifications. (3) Junction temperature = ambient at low temperature limit: junction temperature = ambient +23C at high temperature limit for over temperature guaranteed specifications. (4) Current is considered positive out-of-node. VCM is the input common-mode voltage. (5) Tested < 3dB below minimum specified CMR at CMIR limits. |
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1PCS | 100PCS | 1K | 10K | ||
价 格 | |||||
型 号:NFA31CC221S1E4D 厂 家:MURATA 封 装:SMD 批 号:09+ 数 量:4000 说 明:原装现货 |
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